Teradyne Alumni

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NICK AND ALEX

PEOPLE AND PLACES

PRODUCTS

PUBLICATIONS

Alex d'Arbeloff

Alex d'Arbeloff

Alex d'Arbeloff

Alex d'Arbeloff

Dave Schoeck, customer, Alex d'Arbeloff

Pete Dacey, Alex d'Arbeloff, Faith Debourgknecht

Alex d'Arbeloff, Denis O'Connell

Norm Turner, Alex d'Arbeloff, Byron Brooks

Dick Lucey, Nick Dewolf, Joe Hendriks

Ed Rogas & Jim Prestridge

David Newth (UK) 1972

Chertsey Office (UK) 1972

Nick Cedrone & Jim Prestridge

Rene Verhaegen & Jacques Dupain 1973

opening of Kokomo sales office

Teradye North Reading

5th Floor Lincoln St - 1996

Larry Heller, Larry Klein

Jackie Leveckis

customer, Dave Schoeck, Jeff Hotchkiss

George d'Arbeloff

George Chamillard

4th fl Lincoln - 1984

L200 Test - 1996

Teradyne Munich

Teradyne Eagle Test Systems, Bedford, NH

Steve Brylinsky

Tom Felding, Mark Jageila

Pete Manchester & Jim Hahn

Test Engineering 1996

Roy Graves, Bill Attridge

Tony's Test Group - 1985

Sales Forecast Meeting

Bruce Gaborieault

Dave Giles, Ken Bowden, Alan Blair

Jin-Soo Ko, John Wilcox

Peter Hodgson, Rick Dyck, John Casey

Terabelles: Elaine George, Linda Cohen, Marsha Marsden, Chris Waible, Sally Furst, Denis Bernard, Sue Grainger, Betty Brownfield

Terabelles: George d'Arbeloff, John Russo, Marsha Marsden, Lou Sandler, Denis Bernard, Sue Grainger, Chris Waible, Connie Zaguine

Software Product Services

Software Product Services

Purchasing 1996

John Petrolini, Joe Wrinn, Brad Robbins

Jim Seaton, Bob Van der Kloot

Marc Levine, Stu Osatin

Joe Lewey, Ed Devlin

Abe Bluestone, Sue Grainger

Marilyn Hammond

Laser Throughput

N151 - Marsha Marsden

Any idiot can use this!

L621 with Faith

LF780 LASAR Test Generation Facility

L125 Circuit Diagnostic System - Performance

M365 Instructions

Teradyne ATE Networking System

Official East-West Translator

L135 LSI Board Test System

L135 Series Functional Board Test Systems

L621 Analog Board Test System

Laser Throughput

L125 Circuit Diagnostic System - Implementation

Test System Manager - System Overview

L100 Series Automatic Circuit-Board Test Systems

T317C Discrete Semiconductor Test System

The Cutting Edge

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